• Apple-13632793113
  • Vivi-18038057749
Email:sales@sunsoartech.com Shenzhen Sunsoar Tech Co.,Ltd

Shenzhen Sunsoar Tech Co.,Ltd

Product Categories
Contact Us

Sunsoar Tech

4F, E block, Nanchang Huafeng
The Second Industrial Zone
Hangkong Road, Xixiang Town
Bao'an District, Shenzhen City
China


Contact Information 

Tel: +86 755-82956801

Mob: +86 136 3279 3113

Fax: +86 755-82954160

Email: sales@sunsoartech.com

Web: www.sunsoartech.com

Introduction Of ICT Test Technology In PCBA Test

Introduction of ICT Test Technology in PCBA Test

In the ICT test, the test probe contacts the test points on the PCBA board, and faults such as short circuit, open circuit, and component soldering can be detected. Ability to quantitatively measure resistance, capacitance, inductance, crystal, and other devices, perform functional tests on diodes, transistors, diaphragms, transformers, relays, operational amplifiers, power modules, etc., and perform functional tests on small and medium-scale integrated circuits, such as all 74 series, Memory class, common driver class, exchange class and other ICs.


Some methods of ICT testing are:


1, analog device testing


Use operational amplifiers for testing. The concept of "virtual ground" from "A" points is:


∵Ix = Iref


∴Rx = Vs/ V0*Rref


Vs, Rref are the excitation signal source and the instrument calculates the resistance. If V0 is measured, Rx can be found. If the Rx to be measured is a capacitor or an inductor, then the Vs AC signal source, Rx is in the impedance form, and C or L can also be obtained.


2, Vector test


For digital ICs, Vector tests are used. The vector test is similar to the truth table measurement, the excitation input vector, the measurement output vector, and the quality of the device is judged by the actual logic function test. Such as: NAND gate test


For testing of analog ICs, the corresponding output can be measured based on the actual function of the IC to stimulate the voltage and current and used as a functional block test.


3, non-vector test


With the development of modern manufacturing technology and the use of VLSI circuits, writing vector test programs for devices often takes a lot of time. For example, the 80386 test program takes a skilled programmer for nearly half a year. The numerous applications of SMT devices have made the phenomenon of open faults in the device pins more prominent. For this company's non-vector testing technology, Teradyne introduced MultiScan; GenRad's Xpress non-vector testing technology.


The ICT test is at the back end of the production process. The first procedure of the PCBA test can promptly discover the problems in the production process of the PCBA board, which helps to improve the process and improve the production efficiency.


pcb.png

Copyright © Shenzhen Sunsoar Tech Co.,Ltd. All rights reserved.
QR Code

Shenzhen Sunsoar Tech Co.,Ltd